Coating thickness measurement, based on X-ray fluorescence(XRF), is a widely accepted and industry-proven analytical technique, offering easy to use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U on the periodic table. With superior resolution and high efficiency SDD, the MAXXI 6 is the ideal instrument for measuring the thinnest coatings and element composition at trace level.
- Micro-focus Be window X-ray tube combines high precision, short measurement time with field-proven high reliability, outstanding product life expectancy and low cost of ownership
- Superior resolution Silicon Drift Detector (SDD) offers optimal efficiency at all energy levels with improved limits of detection (LOD)
- Multi collimator optimizes flux generation, enhancing measurement throughput
- Giant slotted chamber design with generous interior volume, ideal for standard and oversized samples
- The USB connection allows operation using a standard computer without additional hardware or firmware
- Made in Germany to the highest engineering standards
- Robust design for long term reliability
- Approved by PTB (Physikalisch Technische Bundesanstalt),ensures highest level of radiation safety